SEM
- 주사전자현미경 : Scanning Electron Microscope
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Quanta FEG 250 is FE-SEM, It is a device that observes the shape and form of materials and nano materials such as metals, semiconductors, ceramics, polymers, organic materials, and bio.
Our equipment can analyze even samples with low conductivity by reducing charging effects phenomenon using Low vacuum mode, and we can analyze the Qualitative Analysis and Quantitative Analysis of materials through EDS.
Equipment Information
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FE-SEM (FEI Quanta FEG 250)
- High Resolution : 2nm at 30keV (X 150K)
- Magnification : ~ 500,000
- High Vacuum / Low Vacuum
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EDS (Energy Dispersive X-ray Spectroscopy)
- Detector size : 10㎟
* Point & Area
* Mapping
* Line scan
Image Analysis
EDS Analysis – Area / Point
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- L.sec : 204.8
- 5.556K Cnts
- 0.840 keV
- Det : Apollo XP-SDD
